Advanced test methods for srams [Electronic resource] : effective solutions for dynamic fault detection in nanoscaled technologies / A. Bosio [et al.]. - Electronic text data. - Boston, Ma : Springer, 2010. - ISBN 978-1-4419-0938-1 : Б. ц. Рубрики: Engineering    Computer aided design    Systems engineering    Engineering    Circuits and systems    Computer-Aided engineering (cad, cae) and design См. : Текст издания Доп.точки доступа: Bosio, A.; Dilillo, L.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; SpringerLink (Online service) Свободных экз. нет