Seebauer, E. G.     Charged semiconductor defects [Electronic resource] : structure, thermodynamics and diffusion / E. G. Seebauer, M. C. Kratzer. - Electronic text data. - London : Springer, 2009. - (Engineering materials and processes, ISSN 1619-0181). - ISBN 978-1-84882-059-3 : Б. ц. Рубрики: Physics    Particles (nuclear physics)    Materials    Electronics    Optical materials    Physics    Solid state physics and spectroscopy    Optical and electronic materials    Continuum mechanics and mechanics of materials    Electronics and microelectronics, instrumentation    Engineering thermodynamics, transport phenomena См. : Текст издания Доп.точки доступа: Kratzer, M.C.; SpringerLink (Online service) Свободных экз. нет